Sensor for rotational velocity and rotational acceleration

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system

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Details

250225, 2502141, 356 28, 324166, G01D 534

Patent

active

057960984

ABSTRACT:
Novel rotation sensors are disclosed, sensors with a temporal resolution of one measurement per rotation. A transparent or absorbing substrate can be coated with a transparent thin film to produce a linear response in reflectance versus angle of incidence over a certain range of angles. The best results were obtained when the incident light was s-polarized. For example, a Si substrate coated with an SiO.sub.2 film was used in constructing a reflection rotation sensor. Experimental results and an error analysis of this rotation sensor are presented.

REFERENCES:
patent: 5059901 (1991-10-01), Van Voorhis
R.M.A. Azzam, "Lima.cedilla.on of Pascal locus of the complex refractive indices of interfaces with maximally flat reflectance-versus-angle curves for incident unpolarized light," J. Opt. Soc. Am. A, vol. 9, pp. 957-963, Jan. 1992.
R.M.A. Azzam et al., "Single-layer-coated surfaces with linearized reflectance versus angle of incidence: application to passive and active silicon rotation sensors," J. Opt. Soc. Am. A, vol. 12, pp. 1790-1796, Mar. 1995.
R.M.A. Azzam, "Stationary property of normal-incidence reflection from isotropic surfaces," J. Opt. Soc. Am., vol. 72, pp. 1187-1189, Sep. 1982.
H.B. Holl, "Specular Reflection and Characteristics of Reflected Light," J. Opt. Soc. Am., vol. 57, pp. 683-690, Jan. 1967.
R.M.A. Azzam, "Angle-of-incidence derivatives of the complex parallel and perpendicular reflection coefficients and their ratio for a film-substrate system," Optica Acta, vol. 30, pp. 1113-1124, Jan. 1983.

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