Sensor device that provides part quality and profile...

Details Sensor device that provides part quality and profile... Sensor device that provides part quality and profile...

2005-04-26

2005-04-26

Pham, Hoa Q. (Department: 2877)

Optics: measuring and testing

Shape or surface configuration

C356S614000, C250S559360

Reexamination Certificate

active

06885463

ABSTRACT:
A sensor device includes a source of radiation that irradiates a plurality of sensing elements. A test object is passed through the spacing between the source of radiation and the sensing elements so that the object blocks the radiation from at least some of the sensing elements. The sensor device provides two-dimensional profile information based upon which ones of the sensing elements are blocked from the radiation and an amount of time that the radiation is blocked at each sensing element. One example use of the inventive arrangement is for monitoring the quality of formed tube ends. Another example disclosed use is for monitoring the quality and characteristics of stripped wire ends.

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Product Brochure—OES Strip Sensor Model 71—undated.
Product Brochure—OES Strip and Seal Sensor Model 97—undated.
Product Brochure—OES Strip/Seal Sensor Model 95—undated.

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