Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Reexamination Certificate
2007-07-17
2007-07-17
Noori, Max (Department: 2855)
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
Reexamination Certificate
active
11051062
ABSTRACT:
A sensor device for examining the surfaces of a work piece, in particular in regard to burrs, is provided wherein said device comprises a probe shaft having a detector head with at least one inductive element, wherein said at least one inductive element couples inductively to the work piece, and wherein the at least one inductive element is constructed and arranged in such a manner that, with respect to a longitudinal axis of the probe shaft, the detector head has a field of view surrounding the probe shaft.
REFERENCES:
patent: 3327584 (1967-06-01), Kissinger
patent: 4199258 (1980-04-01), Dau
patent: 4465374 (1984-08-01), Pryor et al.
patent: 4567347 (1986-01-01), Ito et al.
patent: 4777769 (1988-10-01), McLaughlin et al.
patent: 4824248 (1989-04-01), Neumann
patent: 4894597 (1990-01-01), Ohtomi
patent: 4942672 (1990-07-01), Yoshida
patent: 4967092 (1990-10-01), Fraignier et al.
patent: 5243265 (1993-09-01), Matsuuura et al.
patent: 5302894 (1994-04-01), Hrubes
patent: 5473156 (1995-12-01), Pinnock et al.
patent: 5479929 (1996-01-01), Cooper et al.
patent: 5485082 (1996-01-01), Wisspeintner et al.
patent: 5942693 (1999-08-01), Harms et al.
patent: 6097190 (2000-08-01), Foerster
patent: 6155757 (2000-12-01), Neumann
patent: 6628408 (2003-09-01), Franklin et al.
patent: 6867586 (2005-03-01), Hatcher et al.
patent: 2002/0135361 (2002-09-01), Jagiella et al.
patent: 2004/0051520 (2004-03-01), Jagiella et al.
patent: 2004/0102804 (2004-05-01), Chin
patent: 2004/0136010 (2004-07-01), Jensen et al.
patent: 38 39 386 (1990-05-01), None
patent: 39 10 297 (1990-10-01), None
patent: 40 40 084 (1992-06-01), None
patent: 41 02 721 (1992-08-01), None
patent: 42 17 292 (1993-12-01), None
patent: 42 31 989 (1994-01-01), None
patent: 42 32 837 (1994-03-01), None
patent: 196 24 233 (1997-10-01), None
patent: 198 47 365 (2000-05-01), None
patent: 198 53 302 (2000-05-01), None
patent: 101 03 177 (2002-08-01), None
patent: 102 32 131 (2003-11-01), None
patent: 0 557 558 (1993-09-01), None
patent: 794985 (1958-05-01), None
patent: 363058134 (1988-03-01), None
Patent Abstracts of Japan, Abstract of Japanese Patent “Burr Removing Robot Control Method”, Publication No. 04310360, Nov. 2, 1992, Japanese Application No. 03072794, Filed Apr. 5, 1991.
Patent Abstracts of Japan, Abstract of Japanese Patent “Method and Device of Detecting Casting Skin Surface Around Burr in Casting Burr Removing Work”, Publication No. 63174857, Jul. 19, 1988, Japanese Application No. 62008545, Filed Jan. 16, 1987.
Patent Abstracts of Japan, Abstract of Japanese Patent “Method for Measuring Burr Shape and Dimensions Generated on Plate Shear”, Publication No. 06066536, Mar. 8, 1994, Japanese Application No. 04245804, Filed Aug. 21, 1992.
Patent Abstracts of Japan, Abstract of Japanese Patent “Automatic Shape Tolerance Measuring Method and Its Measuring Instrument”, Publication No. 61111410, May 29, 1986, Japanese Application No. 59232367, Filed Nov. 6, 1984.
Extract from Delphion database relating toJP 2051001, “Method and Device for Measuring Height of Burr”, Issued Feb. 21, 1990, Japanese Application No. 1988000200034, Filed Aug. 12, 1988.
Extract from Delphion database relating toJP 11153414, “Measuring Method of Burr Height and Mold Deviation of Molding”, Issued Jun. 8, 1999, Japanese Application No. 1997000362423, Filed Nov. 21, 1997.
Fericean Sorin
Jagiella Manfred
Balluff GmbH
Lipsitz & McAllister LLC
Noori Max
LandOfFree
Sensor device for the examination of surfaces does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Sensor device for the examination of surfaces, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Sensor device for the examination of surfaces will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3732212