Optics: measuring and testing – Of light reflection – With diffusion
Patent
1988-09-30
1990-12-11
Rosenberger, Richard A.
Optics: measuring and testing
Of light reflection
With diffusion
356371, G01B 1130, G01N 2184, B41F 3310
Patent
active
049765450
ABSTRACT:
Sensor device for analyzing a surface structure includes a lighting device for emitting a focussed beam of light rays directed onto a surface, a radiation detector element for sensing light rays reflected from the surface, and an evaluating device for determining the surface structure from signals emitted by the light-ray detector element, a parameter T.sub.N for the surface structure being determinable by the evaluating device in accordance with a third moment of distribution of intensity of the reflected light rays in accordance with an equation: ##EQU1## wherein n represents a number of measuring points along a scattering indicatrix corresponding to the light rays reflected from the surface; P.sub.i is an initialized measuring signal according to an equation: ##EQU2## wherein I.sub.i is in the intensity of the light rays on a measuring point i; K represents a scaling factor; and M has a value determinable from values for i and P.sub.i in accordance with the equation: ##EQU3##
REFERENCES:
patent: 3922092 (1975-11-01), Dandhker et al.
patent: 4677298 (1987-06-01), Zelmanorie et al.
patent: 4728196 (1988-03-01), Gerstorfer
patent: 4737035 (1988-04-01), Aoki et al.
The Polygraph, pp. 140-145; "Measurement of Surface Roughness by Light Scattering Method", Techn. Nuesseu, 52nd yr, Issue 2, pp. 74-78.
M. A. Berliner, VEB Technical Publications, Berlin, "Measuring Dampness", 1st ed., 1980, pp. 108-113.
Haase Josef
Kipphan Helmut
Greenberg Laurence A.
Heidelberger Druckmaschinen AG
Lerner Herbert L.
Rosenberger Richard A.
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