Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-05-23
2006-05-23
Lee, Diane I. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S076110
Reexamination Certificate
active
07049830
ABSTRACT:
A sensor device includes i sensor elements of a first type and j additional sensor elements of a second type, the i sensor elements of the first type being connected in a circuitry (n×m) matrix array with n row conductors and m column conductors, where i, j, n and m are natural numbers other than zero and where 1≦i≦n*m. Each of the i sensor elements of the first type is connected between one of the n row conductors and one of the m column conductors and each of the j additional sensor elements of the second type is connected between two of the n row conductors.
REFERENCES:
patent: 3573773 (1971-04-01), O'Hanlon
patent: 4374384 (1983-02-01), Moates
patent: 4673933 (1987-06-01), Bauer
patent: 4709228 (1987-11-01), Hucking et al.
patent: 4725816 (1988-02-01), Petterson
patent: 5668544 (1997-09-01), Chang et al.
patent: 6392636 (2002-05-01), Ferrari et al.
patent: 6789034 (2004-09-01), Freed
patent: 6853306 (2005-02-01), Nitschke et al.
I.E.E. International Electronics & Engineering S.ar.l.
Lee Diane I.
McCormick Paulding & Huber LLP
Nguyen Hoai-An D.
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