Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-02-22
2010-12-21
Nguyen, Vincent Q (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S681000
Reexamination Certificate
active
07855566
ABSTRACT:
A sensor system has a support that extends along an observation zone, a row of detection subassemblies arranged one after another on the support and having subcircuits for capturing detection events within respective observation subzones defined by the respective detection subassemblies, and a base circuit on the support. The detection subassemblies are controlled with an alternating voltage having a frequency that forms a carrier frequency based on which a signal dialog occurs between the subcircuits and the base circuit.
REFERENCES:
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patent: 2002/0057020 (2002-05-01), Caldwell
patent: 2003/0085679 (2003-05-01), Bledin et al.
patent: 2005/0243246 (2005-11-01), Edwards et al.
patent: 2006/0117862 (2006-06-01), Shank et al.
patent: 2006/0260417 (2006-11-01), Son et al.
patent: 2521388 (1976-11-01), None
patent: 1277907 (2003-01-01), None
Ident Technology AG
Nguyen Vincent Q
Wilford Alfred
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