Sensor characteristic adjustment circuit for adjusting output ch

Details Sensor characteristic adjustment circuit for adjusting output ch Sensor characteristic adjustment circuit for adjusting output ch

1993-12-23

1996-12-24

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Nonlinear

G01R 1500

Patent

active

055876536

ABSTRACT:
A sensor characteristic adjustment circuit for adjusting the offset and the sensitivity of an output of a semiconductor sensor includes a serial-parallel converter for converting serial data bits into corresponding parallel data bits, a non-volatile memory for storing the parallel data bits, and digital-to-analog converters for converting the digital bits D.sub.1 through D.sub.m and D.sub.m+1 through D.sub.n into values corresponding to the offset and the sensitivity supplied to an adder and a voltage-controlled amplifier, respectively. Preferably, gates are inserted between the serial-parallel converter and the non-volatile memory to separate the non-volatile memory from the serial-parallel converter after the parallel data is written into the non-volatile memory.

REFERENCES:
patent: 4783659 (1988-11-01), Frick
patent: 5051743 (1991-09-01), Orszolak
patent: 5137205 (1992-08-01), Inohara et al.
Brignell et al, "Sensors for Microprocessor-Based Applications", J. Phys. E: Sci. Instrum., vol. 16, 1983, pp. 952-958, 1983 (month unavailable).

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