Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-02-15
2005-02-15
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB
Reexamination Certificate
active
06856161
ABSTRACT:
A sensor array is provided including transistors that are coupled together. The transistors are designed as sensors and wherein the sensor array has switching devices for selecting a transistor and wherein the selected transistor's condition may be detected. The sensor array is set up so that the selected transistor is driven as a source follower and at least some of the transistors are MOS field effect transistors that are configured so that at least some of the transistors are capable of detecting biological material.
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Altera Law Group LLC
Infineon - Technologies AG
Stone Jeffrey R.
Tang Minh N.
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