Sensor arrangement

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C073S146000, C073S146500, C073S159000, C073S862550

Reexamination Certificate

active

07406876

ABSTRACT:
The present invention relates to a system for detecting characteristics of an elastic structure (13, 22, 23, 32, 33, 93, 1202, 1302, 1402), said structure being provided with at least one sensor (111, 112, 14, 211, 212, 311, 312, 911, 1211, 1311, 1411) and said system comprising at least one detector (16, 416, 516, 916, 1316, 1416). The sensor comprises a deformable member, which upon deformation generates a signal convertible to a signal representing said characteristic, said sensor further comprises a passive transmitter and said detector a receiver for receiving said signal representing said characteristic.

REFERENCES:
patent: 4862486 (1989-08-01), Wing et al.
patent: 4898012 (1990-02-01), Jones et al.
patent: 5218861 (1993-06-01), Brown et al.
patent: 5383371 (1995-01-01), Laitinen
patent: 5546070 (1996-08-01), Ellmann et al.
patent: 5559437 (1996-09-01), Baccaud et al.
patent: 5562027 (1996-10-01), Moore
patent: 5565219 (1996-10-01), Hatanaka et al.
patent: 5592875 (1997-01-01), Moschel
patent: 5607703 (1997-03-01), Sakai et al.
patent: 5699729 (1997-12-01), Moschel
patent: 5821433 (1998-10-01), Goldman et al.
patent: 5908537 (1999-06-01), Bentele et al.
patent: 5953230 (1999-09-01), Moore
patent: 6005388 (1999-12-01), Kaefer-Hoffmann et al.
patent: 6105423 (2000-08-01), Prottey
patent: 6246226 (2001-06-01), Kawase et al.
patent: 6370961 (2002-04-01), Trantzas et al.
patent: 6463798 (2002-10-01), Niekerk et al.
patent: 6903704 (2005-06-01), Forster et al.
patent: 6910376 (2005-06-01), Maenpaa
patent: 7132930 (2006-11-01), Wilson et al.
patent: 7185537 (2007-03-01), Muhs
patent: 7239287 (2007-07-01), Forster
patent: 2003/0144119 (2003-07-01), Kleiser et al.
patent: 2004/0079147 (2004-04-01), Mäenpää
patent: 37 41 700 (1989-06-01), None
patent: 197 45 734 (1999-04-01), None
patent: 199 20 133 (2000-11-01), None
patent: 0 538 221 (1993-04-01), None
patent: 0 887 211 (1998-12-01), None
patent: 1 136 804 (2001-09-01), None
patent: 1 237 054 (2002-09-01), None
patent: 973344 (1997-08-01), None
patent: 2580997 (1986-10-01), None
patent: 2592954 (1987-07-01), None
patent: 2645799 (1990-10-01), None
patent: 56138009 (1981-10-01), None
patent: 4254730 (1992-10-01), None
patent: WO 00/02741 (2000-01-01), None
patent: WO 00/58704 (2000-10-01), None
patent: WO 01/68388 (2001-09-01), None
patent: WO 02/066239 (2002-08-01), None
patent: WO 02/086435 (2002-10-01), None
patent: WO 02/099188 (2002-12-01), None
patent: WO 03/027623 (2003-03-01), None
PCT International Preliminary Report on Patentability dated Jul. 22, 2005, for International Application No. PCT/SE2004/000062.
PCT Written Opinion of the International Searching Authority dated Apr. 23, 2004, for International Application No. PCT/SE2004/000062.
English Translation of Office Action dated May 18, 2007 for corresponding Chinese Application No. 200480002259.4.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Sensor arrangement does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Sensor arrangement, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Sensor arrangement will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3999151

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.