Measuring and testing – Probe or probe mounting
Patent
1995-12-19
1997-08-26
Noland, Thomas P.
Measuring and testing
Probe or probe mounting
73304R, G01D 512, G01M 1900, G01F 2324
Patent
active
056612516
ABSTRACT:
A sensor apparatus is provided for transmitting electrical pulses from a signal line into a vessel to measure a process parameter. The sensor apparatus includes a lower flange configured to be coupled to the vessel. The lower flange is formed to include a central aperture defined by a radially outwardly tapered surface located adjacent a top surface of the lower flange. The apparatus also includes a conductive probe element including a head having first and second radially outwardly tapered surfaces and an elongated conductive portion extending away from the head. The first tapered surface of the head is configured to engage the tapered surface of the lower flange to prevent movement of the probe element in a direction toward the lower flange. The apparatus further includes an upper flange configured to be coupled to the lower flange to secure the probe element to the lower flange. The upper flange includes a central aperture defined by a radially outwardly tapered surface located adjacent a bottom surface of the upper flange. The tapered surface of the upper flange is configured to engage the second tapered surface of the probe element to prevent movement of the probe element in a direction toward the upper flange. The apparatus still further includes a launch plate coupled to the upper flange, and an electrical connector coupled to the probe element. The connector is configured to couple the signal line to the probe element.
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Cummings Donald D.
Perdue Kenneth L.
Wartmann Gerd
Endress & Hauser GmbH & Co.
Noland Thomas P.
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