Sensor and method for measuring changes in environmental conditi

Details Sensor and method for measuring changes in environmental conditi Sensor and method for measuring changes in environmental conditi

1998-07-30

2000-09-12

Kim, Robert H.

Optics: measuring and testing

By particle light scattering

With photocell detection

356354, 356352, G01B 902

Patent

active

061185345

ABSTRACT:
A sensor has an interferometer which measures a change in an applied environmental condition relative to a reference environmental condition. The interferometer is operated under the applied environmental condition to generate an interference spectrum. Intensities of the interference spectrum are measured at first and second wavelengths, respectively. The first and second wavelengths correspond to first and second reference intensities that lie on respective sides of an extremum in the interference spectrum when the interferometer is operated under the reference condition. Measurement of the change in the applied environmental condition is based on the measured intensities and the first and second reference intensities.

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Product brochure, "Metricor 2000 The Universal Fiber-Optic-Sensor Instrument", 4 pages.
Product literature, "Microchip Technology", 7 pages.

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