Sensing probe for determining location of conductive features

Details Sensing probe for determining location of conductive features Sensing probe for determining location of conductive features

1978-05-30

1980-10-07

Strecker, Gerard R.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 51, 324158F, G01R 1073, G01R 3102

Patent

active

042271495

ABSTRACT:
A sensing apparatus for determining the precise location of a conductive feature on an insulating substrate which has a base, a plurality of flexible flat elongated contact blade elements having end portions for contacting and establishing electrical contact to a conductive surface feature, insulating means between the blade elements, and a base member for supporting the blade elements in a bowed condition with the end portions arranged in a plane parallel to the plane of the top surface of the insulating substrate.

REFERENCES:
patent: 2932015 (1960-05-01), Kelly
patent: 3611128 (1971-10-01), Nagata
patent: 3676776 (1972-07-01), Bauer et al.
patent: 3806801 (1974-04-01), Bove
patent: 3996516 (1976-12-01), Luther
patent: 4019015 (1977-04-01), Hassan et al.
patent: 4052793 (1977-10-01), Coughlin et al.
patent: 4063172 (1977-12-01), Faure et al.
patent: 4177425 (1979-12-01), Lenz
Bruder et al., Buckling Beam Probe, IBM Tech. Discl. Bulletin, vol. 16, No. 5, Oct. 1973, p. 1366.
Dougherty, W. E., Probe Tips, IBM Technical Disclosure Bulletin, vol. 18, No. 10, Mar. 1976, p. 3304.
Grandia et al., Rapid-Loading, Low-Stress Sample Holder, IBM Tech. Disc. Bull., vol. 12, No. 4, Sep. 1969, p. 595.
Till, A. W., Column Contact Probe, IBM Tech. Disc. Bull., vol. 12, No. 4, Sep. 1969, p. 551.

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