Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2007-06-13
2008-12-02
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C341S126000
Reexamination Certificate
active
07460973
ABSTRACT:
A sensing apparatus includes a microprocessor having an A/D converting function of digital-converting an analog electric quantity supplied to an A/D conversion port and taking in a conversion result, and a plurality of electrical elements that are connected with the microprocessor and generate analog electric quantities. The plurality of electrical elements are respectively connected with a plurality of switch ports in the microprocessor that can be selectively grounded by internal switches of the microprocessor. Analog electric quantities generated in the electrical elements can be selectively taken into the A/D converting function of the microprocessor by selectively switching the internal switches.
REFERENCES:
patent: 5737630 (1998-04-01), Kobayashi
patent: 6184666 (2001-02-01), Boeckmann et al.
patent: 6331822 (2001-12-01), Sato et al.
Itagaki Shinichi
Kobayashi Masayuki
Bui Bryan
Sanyo Electric Co,. Ltd.
Westerman, Hattori, Daniels & Adrian , LLP.
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