Sense amplifier with dual parallel driver transistors in MOS ran

Electrical transmission or interconnection systems – Personnel safety or limit control features – Interlock

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307DIG3, 365205, H03K 524, H03K 3353, G11C 706

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042861780

ABSTRACT:
A random access memory device of the MOS integrated circuit type employs an array of rows and columns of one-transistor storage cells with a bistable sense amplifier circuit at the center of each column. Instead of a single pair of cross-coupled driver transistors forming the bistable circuit, dual parallel pairs are used. One pair used in the initial sensing has a long channel length so that the pair may be more readily matched, while the other pair used later in the cycle for driving the zero-going side of the column line to ground has a shorter channel to enhance speed.

REFERENCES:
patent: 3983412 (1976-09-01), Roberts et al.
patent: 4039861 (1977-08-01), Heller et al.
patent: 4045783 (1977-08-01), Harland
patent: 4050061 (1977-09-01), Kitagawa
patent: 4069475 (1978-01-01), Boettcher
patent: 4081701 (1978-03-01), White, Jr. et al.
patent: 4087704 (1978-05-01), Mehta et al.
patent: 4110841 (1978-08-01), Schroeder
patent: 4119870 (1978-10-01), Zibert
patent: 4150311 (1979-04-01), Matsuda et al.
Gionis, Ebel and Gegitz, -IEEE Journal of Solid-State Circuits; vol.-SC-10, No. 5, pp. 262-267; 10/1975.

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