Semiconductor wafer processing method and apparatus with heat an

Coating apparatus – Gas or vapor deposition – With treating means

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

118715, 118720, 118724, 118728, 118730, 118733, C23C 1600

Patent

active

053564766

ABSTRACT:
A semiconductor wafer processing apparatus is provided with a susceptor for supporting a wafer for CVD of films such as blanket or selective deposition of tungsten or titanium nitride, and degassing and annealing processes. Preferably, a downwardly facing showerhead directs a gas mixture from a cooled mixing chamber onto an upwardly facing wafer on the susceptor. Smooth interior reactor surfaces include baffles and a susceptor lip and wall shaped to minimize turbulence. Inert gases flow to minimize turbulence by filling gaps in susceptor structure, prevent contamination of moving parts, conduct heat between the susceptor and the wafer, and vacuum clamp the wafer to the susceptor. A susceptor lip surrounds the wafer and is removable for cleaning, to accommodate different size wafers, and allows change of lip materials to for different processes, such as, one which will resist deposits during selective CVD, or one which scavenges unspent gases in blanket CVD. The lip smooths gas flow, reduces thermal gradients at the wafer edge. The susceptor design reduces heat flow from the susceptor to other reactor parts by conduction or radiation.

REFERENCES:
patent: 4512391 (1985-04-01), Harra
patent: 4599135 (1986-07-01), Tsunekawa et al.
patent: 4649859 (1987-03-01), Wanlass
patent: 4714594 (1987-12-01), Mircea
patent: 4743570 (1988-05-01), Lamont, Jr.
patent: 4807562 (1989-02-01), Sandys
patent: 4976996 (1990-12-01), Monkowski et al.
patent: 4986216 (1991-01-01), Ohmori et al.
patent: 4996942 (1991-03-01), deBoer et al.
patent: 5016332 (1991-05-01), Reichelderfer
patent: 5173336 (1992-12-01), Kennedy
patent: 5186756 (1993-02-01), Benko et al.
"Plasma Silicon Nitride Deposition System PND 301", Operation and Maintenance Manual LFE, Manual 256917, Rev. A, Mar. 1983.
Houtman, C. et al., "Large Scale Finite Element Computations of Reacting Flows in CVD Reactors", Fifth European Conference on CVD, Uppsala, Sweden, Jun. 1985.
Winkler, E., "Novellus Enters Tungsten CVD", Solid State Technology, Aug. 1991.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor wafer processing method and apparatus with heat an does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor wafer processing method and apparatus with heat an, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor wafer processing method and apparatus with heat an will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2369628

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.