Semiconductor wafer having machine readable indicies

Details Semiconductor wafer having machine readable indicies Semiconductor wafer having machine readable indicies

1974-06-10

1977-03-01

Cook, Daryl W.

Registers

Calculators

Input-output calculator to indicator, printer, etc.

250566, G06K 710, G08C 906

Patent

active

040103552

ABSTRACT:
Machine readable identifying indices for a semiconductor wafer having a top surface, a bottom surface, and at least one flat edge is placed on the bottom surface of the semiconductor wafer, positioned in a predetermined relationship to the flat edge, desirably parallel to the flat edge. Means is provided for directing a first beam of radiant energy at the machine readable code and a second beam of radiant energy at the semiconductor wafer proximate to the machine readable code. Sensing means detects the first and second beams after impinging on the semiconductor wafer. A differential amplifier produces a series of output pulses representing the machine readable code. The output from the sensing means constitutes the inputs to the differential amplifier. In a preferred form, the machine readable code is a bar code including error check symbols. This approach gives a simplified means for identifying semiconductor wafers that is highly reliable.

REFERENCES:
patent: 2952008 (1960-09-01), Mitchell et al.
patent: 3609306 (1971-09-01), Langley
patent: 3673389 (1972-06-01), Kapsambelis et al.
patent: 3761725 (1973-09-01), Meyer

Affiliated with

Also associated with

Rating

Semiconductor wafer having machine readable indicies does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor wafer having machine readable indicies, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor wafer having machine readable indicies will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1353880