Semiconductor device manufacturing: process – Gettering of substrate – By implanting or irradiating
Patent
1996-05-21
1999-02-23
Niebling, John F.
Semiconductor device manufacturing: process
Gettering of substrate
By implanting or irradiating
438143, H01L 21265
Patent
active
058743480
ABSTRACT:
In a semiconductor wafer according to this invention, an epitaxial layer is formed on the surface of a semiconductor substrate, a second element which is not the same but homologous as a first element constituting the semiconductor substrate is present to have a peak concentration on the semiconductor substrate side rather than the surface, and this peak concentration is 1.times.10.sup.16 atoms/cm.sup.3 or more.
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Higuchi Takayoshi
Kanbe Hideo
Kusaka Takahisa
Ohashi Masanori
Takizawa Ritsuo
Kananen Ronald P.
Mulpuri S.
Niebling John F.
Sony Corporation
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