Semiconductor testing circuit and semiconductor testing method

Details Semiconductor testing circuit and semiconductor testing method Semiconductor testing circuit and semiconductor testing method

2008-07-16

2010-06-08

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S763010, C324S1540PB, C714S030000, C714S733000

Reexamination Certificate

active

07733112

ABSTRACT:
A semiconductor testing circuit of the present invention includes a signal line which is connected to a terminal not to be tested and a plurality of terminals to be tested of a semiconductor device; switch circuits for controlling electrical connection/disconnection between the signal line and the terminals to be tested; and a resistor connected to one end of the signal line. With this configuration, in a test on the AC characteristics of an input signal, a test signal generated by an LSI tester can be inputted to the terminals to be tested through the terminal not to be tested and the signal line by turning on the switch circuits.

REFERENCES:
patent: 4904883 (1990-02-01), Iino et al.
patent: 6275055 (2001-08-01), Hyozo et al.
patent: 6720785 (2004-04-01), Bette
patent: 7466159 (2008-12-01), Ito et al.
patent: 2003/0038650 (2003-02-01), Combs et al.
patent: 10-288647 (1998-10-01), None

Affiliated with

Also associated with

Rating

Semiconductor testing circuit and semiconductor testing method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor testing circuit and semiconductor testing method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor testing circuit and semiconductor testing method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4167643