Semiconductor testing apparatus with a variable delay circuit

Details Semiconductor testing apparatus with a variable delay circuit Semiconductor testing apparatus with a variable delay circuit

2005-11-22

2005-11-22

Nguyen, Linh My (Department: 2816)

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Having specific delay in producing output waveform

C714S700000

Reexamination Certificate

active

06967516

ABSTRACT:
A variable delay circuit comprises: a delay compensation unit, which has a plurality of referential delay units that include different numbers of first variable delay elements, the delay amount of which varies based on a control signal, the delay compensation unit generates each of a plurality of the control signals, which are provided to the first variable delay elements, according to a number of the first variable delay elements; and a delay unit which generates the desired delay amount by controlling a plurality of second variable delay elements, which have a same characteristic with the first variable delay elements, by the plurality of control signals.

REFERENCES:
patent: 2-159815 (1990-06-01), None
patent: 5-129909 (1993-05-01), None
patent: 5-129910 (1993-05-01), None
patent: 9-93098 (1997-04-01), None
Japanese Office Action dated Jan. 22, 2004 (2 pgs.).
Patent Abstracts of Japan; Publication No. 09-093098 dated Apr. 4, 1997 (2 pgs.).
Patent Abstracts of Japan; Publication No. 05-129910 dated May 25, 1993 (2 pgs.).
Patent Abstracts of Japan; Publication No. 05-129909 dated May 25, 1993 (2 pgs.).
Patent Abstracts of Japan; Publication No. 02-159815 dated Jun. 20, 1990.

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