Semiconductor testing apparatus

Details Semiconductor testing apparatus Semiconductor testing apparatus

1998-01-26

2000-02-29

Karlsen, Ernest

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 324537, G01R 3102

Patent

active

060313706

ABSTRACT:
A semiconductor testing apparatus is disclosed which is able to lower the cost of a facility by using a power supply cable of narrow gauge, and to control the level of the power supply cable of every pin electronic circuit. A high DC voltage transformer G transforms the commercial AC power supply voltage into high DC voltage. Low DC voltage trabsformers B, B1, B2 receive said high DC voltage via power cables 2, 21, 22 and transform the high DC voltage into the required low DC voltage. The pin electronic circuits D, D1, D2 are connected to said low DC voltage trabsformers B, B1, B2. The circuits B, B1, B2 receive the above low DC voltage and supply the testing output signals to the semiconductor devices E, E1, E2 being tested.

REFERENCES:
patent: 3824441 (1974-07-01), Heyman et al.
patent: 4180203 (1979-12-01), Masters
patent: 4637020 (1987-01-01), Schinabeck
patent: 4656632 (1987-04-01), Jackson
patent: 5101153 (1992-03-01), Morong, III
patent: 5424934 (1995-06-01), Tanuma et al.

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