Semiconductor testing apparatus

Details Semiconductor testing apparatus Semiconductor testing apparatus

1997-05-15

1999-04-13

Williams, Hezron E.

Boots, shoes, and leggings

364580, 371 211, 371 221, 371 251, 39518306, 39518307, 39518308, 39518312, G11C 2900

Patent

active

058944249

ABSTRACT:
The present invention offer a semiconductor testing apparatus which is able to test all functions of a semiconductor device in a short time. The semiconductor testing apparatus comprises a conditional imperative statement part storing therein all statements concerning conditional setting for the measuring means, a first comparison part for comparing statement received from the control means with the respective statements stored in the conditional imperative statement part, and a second comparison part for comparing the statements received from the control means with the respective statements stored in the memory means.

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patent: 5673274 (1997-09-01), Yoshida
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