Semiconductor testing and apparatus therefor

Details Semiconductor testing and apparatus therefor Semiconductor testing and apparatus therefor

1985-03-20

1988-05-24

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 73R, G01R 3102, G01R 3128

Patent

active

047468564

ABSTRACT:
A semiconductor die is positioned and examined by means of scanning certain strategic regions which border or overlap said die. The video which results from the scanning is digitized. For example, black is represented by an "0" and white is represented by a "1". The results may be compared with an acceptable pattern to determine a good die and statistically analyzed to see if the data represents the die or surrounding street.

REFERENCES:
patent: 4051437 (1977-09-01), Lile et al.
patent: 4360831 (1982-11-01), Kellar

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