Semiconductor testing

Details Semiconductor testing Semiconductor testing

2006-08-01

2006-08-01

Nguyen, Vincent Q. (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S527000

Reexamination Certificate

active

07084648

ABSTRACT:
A method of testing a semiconductor circuit including a pair of contact pads, a biasing circuit for applying a voltage to the pair of contact pads, and a sensing circuit for providing a signal indicative of the voltage applied across the contact pads. The method includes determining a voltage gain and voltage offset of the sensing circuit while the biasing circuit is disabled. The method also includes enabling the biasing circuit to produce a voltage across the contact pads and determining, from the resulting output voltage produced by the sensing circuit, an actual output voltage produced by the biasing circuit at the contact pads based on the determined voltage gain and voltage offset of the sensing circuit.

REFERENCES:
patent: 5659255 (1997-08-01), Strid et al.
patent: 5999010 (1999-12-01), Arora et al.
patent: 6127831 (2000-10-01), Khoury et al.
patent: 6261854 (2001-07-01), Akram et al.
patent: 6262580 (2001-07-01), Wu
patent: 6323661 (2001-11-01), Wildes et al.
patent: 6469537 (2002-10-01), Akram et al.
patent: 6597182 (2003-07-01), Tachibana
patent: 6734458 (2004-05-01), Kim et al.
patent: 6777967 (2004-08-01), Iino et al.

Affiliated with

Also associated with

Rating

Semiconductor testing does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor testing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor testing will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3630492