Semiconductor test system with integrated test head manipulator

Details Semiconductor test system with integrated test head manipulator Semiconductor test system with integrated test head manipulator

1997-12-02

2000-02-29

Ballato, Josie

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324754, G01R 3126

Patent

active

060313870

ABSTRACT:
A semiconductor integrated circuit test system, for testing semiconductor integrated circuit devices includes a test head containing pin electronics circuits and a device handler for receiving semiconductor integrated circuit devices to be tested and delivering the devices to a test station for engagement with the test head. The device handler includes a mechanical support structure, a test head manipulator having a first part rigidly attached to the mechanical support structure, a second part which is movable relative to the first part and to which the test head is attached, and a motor effective between the first and second parts of the manipulator for moving the second part relative to the first part. A power server is attached to the device handler independently of the test head manipulator. A cable connects the power server to the pin electronics circuits of the test head.

REFERENCES:
patent: 4574235 (1986-03-01), Kelly et al.
patent: 5091693 (1992-02-01), Berry et al.
patent: 5510724 (1996-04-01), Itoyama et al.
patent: 5546405 (1996-08-01), Golla
patent: 5644245 (1997-07-01), Saitoh et al.
patent: 5754057 (1998-05-01), Hama et al.

Affiliated with

Also associated with

Rating

Semiconductor test system with integrated test head manipulator does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor test system with integrated test head manipulator , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor test system with integrated test head manipulator will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-686379