Semiconductor test system including a novel driver/load circuit

Details Semiconductor test system including a novel driver/load circuit Semiconductor test system including a novel driver/load circuit

1994-11-21

1996-05-28

Nguyen, Vinh P.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, G01R 3122

Patent

active

055214932

ABSTRACT:
A novel pin electronics design and method is taught which serves to minimize the capacitive loading of the driver and load portion of the pin electronics. The driver and load circuitry are combined to form a novel driver/load circuit, thereby reducing capacitive loading, simplifying circuit structure, and improving the speed of operation of the test system and the accuracy of the test.

REFERENCES:
patent: 3549995 (1970-12-01), Trousdale et al.
patent: 4583223 (1986-04-01), Inoue et al.
patent: 4929888 (1990-05-01), Yoshida
patent: 5200696 (1993-04-01), Menis et al

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