Semiconductor test system having a tester and a prober and...

Details Semiconductor test system having a tester and a prober and... Semiconductor test system having a tester and a prober and...

2006-05-09

2006-05-09

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C327S003000

Reexamination Certificate

active

07042237

ABSTRACT:
A semiconductor test system having a tester and a prober and the test method thereof are proposed. A test mark signal and a control board having a discrimination circuit and a protection circuit are added to a test connection interface of the tester. When performing multi-chip test, the connection result is displayed after checking the test mark signal by the discrimination circuit. Whether the test can be performed or not is then determined by the protection circuit. When the interface connection is incorrect due to man-made carelessness, an alarm will buzz for warning, and the protection circuit will be simultaneously activated to disable the tester. Normal test can be performed only if the interface connection is correct. Thereby, the correctness of the test results can be ensured to reduce returned purchase and to enhance the quality of production.

REFERENCES:
patent: 6906542 (2005-06-01), Sakagawa et al.
patent: 6970004 (2005-11-01), Ishitani et al.

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