Semiconductor test system and method of operating the same

Details Semiconductor test system and method of operating the same Semiconductor test system and method of operating the same

2005-06-28

2005-06-28

Tokar, Michael (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C324S765010

Reexamination Certificate

active

06911815

ABSTRACT:
A semiconductor test system and method for the same. A handler is capable of moving and classifying semiconductor packages, a logic tester is capable of receiving a semiconductor package from the handler, and for testing a logic component of the semiconductor package. An analog tester may be coupled to the logic tester, where the analog tester is capable of testing an analog component of the semiconductor package. An interface unit may be included for selectively outputting a logic signal to enable the analog tester.

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