Semiconductor test system

Details Semiconductor test system Semiconductor test system

2007-02-06

2007-02-06

Metjahic, Safet (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S760020, C324S076150

Reexamination Certificate

active

09443021

ABSTRACT:
A mixed signal test system for testing a semiconductor device having both an analog function and a digital function achieves improved resolution and low cost. The test system is formed of a functional test unit for testing a digital function of a device under test (DUT), an analog test unit (ATU) for testing an analog function of the DUT, and a synchronous control unit for synchronizing operations between the functional test unit and the analog test unit. The analog test unit includes a digitizer for converting an analog output of the DUT into a digital signal, and an acquisition memory for storing the digital signal from the digitizer in specified addresses. The wave form of the analog output is repeated by a plurality of cycles and a sampling clock for the digitizer is phase shifted by a predetermined amount for each cycle.

REFERENCES:
patent: 4641246 (1987-02-01), Halbert et al.
patent: 4755951 (1988-07-01), Holister
patent: 4807147 (1989-02-01), Halbert et al.
patent: 4967150 (1990-10-01), Brust
patent: 5589763 (1996-12-01), Burns
patent: 5748124 (1998-05-01), Rosenthal et al.
patent: 5875213 (1999-02-01), Asami et al.
patent: 5909186 (1999-06-01), Gohringer
patent: 6087825 (2000-07-01), Eguchi et al.
patent: 6265860 (2001-07-01), Eguchi et al.

Affiliated with

Also associated with

Rating

Semiconductor test system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor test system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor test system will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3857270