Semiconductor test system

Details Semiconductor test system Semiconductor test system

2006-11-14

2006-11-14

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C324S755090, C324S765010

Reexamination Certificate

active

07135853

ABSTRACT:
A semiconductor test system includes a semiconductor test apparatus for providing a test signal to a device under test and performing a test on the device under test, a performance board for electrically coupling the semiconductor test apparatus and the device under test and a conveyance apparatus for conveying the device under test to electrically couple the device under test to the performance board. The conveyance apparatus includes a box for containing the performance board therein and a conveyance arm for conveying the device under test in order to press the device under test to the performance board and pressing the performance board to an inner face of the box via the device under test, so that a rear face of the performance board is pressed to the box, wherein the rear face corresponds to a position to which the device under test is pressed.

REFERENCES:
patent: 5703494 (1997-12-01), Sano
patent: 6104204 (2000-08-01), Hayama et al.
patent: 6545458 (2003-04-01), Yamazaki
patent: 6545493 (2003-04-01), Iino
patent: 6838897 (2005-01-01), Kim et al.
patent: 60-190875 (1985-09-01), None
patent: 10-160788 (1998-06-01), None
WIPO Search Report with Written Opinion dated Dec. 21, 2004 (6 pages).
Patent Abstracts of Japan; Publication No. 10-160788 dated Jun. 19, 1998 (1 page).
Patent Abstracts of Japan; Publication No. 60-190875 dated Sep. 28, 1985 (1 page).

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