Semiconductor test system

Details Semiconductor test system Semiconductor test system

1996-11-20

1998-10-27

Barlow, Jr., John E.

Data processing: measuring, calibrating, or testing

Testing system

Including specific communication means

702123, 371 251, 371 271, G06F 1100

Patent

active

058289852

ABSTRACT:
A software structure in a semiconductor test system for easily modifying and transferring data for controlling a hardware when the hardware is changed or replaced. The semiconductor test system includes, an input for providing a test program for specifying various test conditions necessary to test the semiconductor device under test, a master processor for converting the test program to an object code and interpreting the contents of the test program, a processor interface for storing data indicating the hardware characteristics of the semiconductor test system in a table format to assist the interpretation of the test program in the master processor and modifying the table format data in response to the change in the hardware, a library having data tables based on the specification of the semiconductor test system for converting the format of the data compiled and interpreted by the master processor to data of a hardware format, and a driver for transmitting the hardware format data to registers in the hardware of the semiconductor test system through a data bus.

REFERENCES:
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patent: 4961191 (1990-10-01), Nakagawa et al.
patent: 5161160 (1992-11-01), Yaguchi et al.
patent: 5381421 (1995-01-01), Dickol et al.
patent: 5673274 (1997-09-01), Yoshida

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