Semiconductor test socket and contacts

Details Semiconductor test socket and contacts Semiconductor test socket and contacts

1996-06-17

1998-04-21

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324758, G01R 3102

Patent

active

057421706

ABSTRACT:
A semiconductor device test socket is disclosed which includes one or more flexible replaceable shielded solderless multiple contact assemblies. The multiple contact assemblies provide electrical communication between a semiconductor device under test and a semiconductor device test circuit. The semiconductor device has a plurality of accessible terminals contacted by the multiple contact assemblies and is held in an insulating device carrier which also serves to protect the device terminals from damage during insertion of the device into the test socket. The carrier is secured in a test socket base by a releasable latch for testing over a period of time and/or in controlled environments.

REFERENCES:
patent: 4419626 (1983-12-01), Cedrone et al.
patent: 4686468 (1987-08-01), Lee et al.
patent: 4912399 (1990-03-01), Greub et al.
patent: 5502397 (1996-03-01), Buchanan
patent: 5521518 (1996-05-01), Higgins

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