Semiconductor test socket and contacts

Details Semiconductor test socket and contacts Semiconductor test socket and contacts

1994-11-18

1996-09-17

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

439 72, G01R 1073, G01R 3102

Patent

active

055572120

ABSTRACT:
A semiconductor device test socket is disclosed which includes one or more flexible replaceable shielded solderless multiple contact assemblies. The multiple contact assemblies provide electrical communication between a semiconductor device under test and a semiconductor device test circuit. The semiconductor device has a plurality of accessible terminals contacted by the multiple contact assemblies and is held in an insulating device carrier which also serves to protect the device terminals from damage during insertion of the device into the test socket. The carrier is secured in a test socket base by a releasable latch for testing over a period of time and/or in controlled environments.

REFERENCES:
patent: 3377514 (1968-04-01), Ruehlemann et al.
patent: 3391383 (1968-07-01), Antes
patent: 4560216 (1985-12-01), Egawa
patent: 4649339 (1987-03-01), Grangroth et al.
patent: 4733172 (1988-03-01), Smolley
patent: 5087877 (1992-02-01), Frentz et al.
patent: 5172049 (1992-12-01), Kiyokawa et al.
patent: 5313157 (1994-05-01), Pasiecznik, Jr.
patent: 5444388 (1995-08-01), Ideta et al.

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