Semiconductor test instrument

Details Semiconductor test instrument Semiconductor test instrument

2007-03-27

2007-03-27

Karlsen, Ernest (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C714S744000

Reexamination Certificate

active

10538901

ABSTRACT:
Output data of a device under test (DUT) is obtained at timing of both rising and falling edges of a clock output from the DUT, and output data of a DDR type device is fetched in synchronization with the clock. A semiconductor test apparatus comprises a clock side time interpolator20which obtains clocks input from a DUT1by a plurality of strobes of constant timing intervals and which outputs the clocks as time-sequential level data, a data side time interpolator20which obtains output data input from the DUT1by a plurality of strobes of constant timing intervals and which outputs the output data as time-sequential level data, and an edge selector30which switches the time-sequential level data obtained by the time interpolators20and selectively outputs level data indicating rising and/or falling edges of the level data.

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patent: WO 97/04327 (1997-02-01), None

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