Semiconductor test device having clock recovery circuit

Details Semiconductor test device having clock recovery circuit Semiconductor test device having clock recovery circuit

2007-03-06

2007-03-06

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB, C714S731000, C714S744000

Reexamination Certificate

active

10512296

ABSTRACT:
A semiconductor test device for acquiring a multiplexed clock signal from LSI output data and using the clock to test the LSI. The device includes a time interpolator and registers connected in series. The time interpolator has flip-flops connected in parallel for receiving output data from an LSI under test, a delay circuit for successively inputting strobes delayed at a constant timing interval to the flip-flops and outputting time-series level data, and an encoder for receiving the time-series level data from the flip-flops and encoding it into position data indicating an edge timing. The registers successively store position data from the encoder and output them at a predetermined timing. The device further includes a digital filter for outputting the position data from the registers as a recovery clock.

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