Semiconductor test device

Details Semiconductor test device Semiconductor test device

2008-10-30

2010-06-08

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S073100

Reexamination Certificate

active

07733113

ABSTRACT:
A semiconductor test device of the present invention for conducting a test on a device under test, includes: a plurality of comparison units which compare a signal obtained from the device under test with a predetermined reference voltage and output a comparison result; a plurality of measuring units which are provided in correspondence with the plurality of comparison units, and measure a time from when a measurement start signal is input thereto to when the comparison result from a corresponding comparison unit is input thereto, and output a measuring result; a start signal output unit which outputs the measurement start signal at a same timing to each of the plurality of measuring units; and a computation unit which computes time differences between a plurality of signals obtained from the device under test based on the measuring results of the plurality of measuring units.

REFERENCES:
patent: 4497056 (1985-01-01), Sugamori
patent: 4931723 (1990-06-01), Jeffrey et al.
patent: 4994732 (1991-02-01), Jeffrey et al.
patent: 5225775 (1993-07-01), Sekino
patent: 5311486 (1994-05-01), Alton et al.
patent: 6198699 (2001-03-01), Yamabe
patent: 3594135 (2004-09-01), None

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