Semiconductor test device

Details Semiconductor test device Semiconductor test device

2007-03-20

2007-03-20

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C330S255000, C330S263000

Reexamination Certificate

active

10935894

ABSTRACT:
The present invention provides a semiconductor test device that can output a higher voltage as a driver output without increasing power consumption of a high-speed driver, so as to test a device under test. In order to achieve this, the semiconductor test device for switching a driver output between a plurality of voltages and a higher voltage that is higher than said plurality of voltages and outputting said driver output to test a device under test, includes: a first buffer portion operable to output said plurality of voltages by a push-pull circuit of an emitter follower serving as a source and an emitter follower serving as a sink; and a second buffer portion operable to output said higher voltage by a push-pull circuit of said emitter follower serving as said sink of said first buffer portion and an emitter follower serving as a source of said higher voltage.

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