Semiconductor test data analysis system

Details Semiconductor test data analysis system Semiconductor test data analysis system

2005-05-24

2005-05-24

Tsai, Carol S. W. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S016000, C702S031000, C702S032000, C702S119000, C702S120000, C702S122000

Reexamination Certificate

active

06898545

ABSTRACT:
A semiconductor test data analysis system (1) automatically recording, during an analysis operation, operation information of the analysis operation, including analysis conditions or an analysis procedure for input test data, or analysis information obtained by the analysis operation. The analysis system includes a processing means (101), an analysis target data storage means (109), which stores the test data as analysis target data, a historical data storage means (107), which stores as historical data either operation information of the analysis operation or analysis information obtained by the analysis operation, and a display data storage means (112), which stores analysis information obtained by the analysis operation, which stores analysis display data generated by the processing means for the purpose of displaying the analysis information obtained by the analysis operation. In this system, when a new analysis operation is specified, the processing means (101) processes the input test data in accordance with the analysis operation, and processes at least one of the analysis target data, historical data, and display data by the new analysis operation.

REFERENCES:
patent: 5568408 (1996-10-01), Maeda
patent: 5761417 (1998-06-01), Henley et al.
patent: 6097204 (2000-08-01), Tanaka et al.
patent: 6292766 (2001-09-01), Mattos et al.
patent: 6319737 (2001-11-01), Putnam et al.
patent: 6553546 (2003-04-01), Murakami
patent: 6567168 (2003-05-01), Nara et al.
patent: 6603691 (2003-08-01), Yoo et al.
patent: 6629090 (2003-09-01), Tsuda et al.
patent: 20010005132 (2001-06-01), Nishikawa et al.
patent: 20020061606 (2002-05-01), Honma et al.
patent: 20020165692 (2002-11-01), Sato et al.
patent: 20020170022 (2002-11-01), Shirai et al.
patent: 20030013249 (2003-01-01), Honma et al.
patent: 20030074098 (2003-04-01), Cheung et al.
patent: WO 9324896 (1993-12-01), None
IDS Software Systems. Enabling Data-Driven Yield Management Decisions. Eric Boskin, Volterra Semiconductor. Jun. 28, 2002.

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