Semiconductor test circuit

Details Semiconductor test circuit Semiconductor test circuit

2007-05-22

2007-05-22

Nguyen, Vincent Q. (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S765010, C702S117000

Reexamination Certificate

active

11344845

ABSTRACT:
A semiconductor test circuit is installed inside a semiconductor device to measure the state of at least one electrical signal of the semiconductor device, and includes first, second, and Nth signal selecting units (where N is an integer greater than 2). The first signal selecting unit either outputs a first electrical signal received from a first terminal or provides a high impedance state to a pad connected to a second terminal in response to a first control signal. The second signal selecting unit either outputs a second electrical signal received from a first terminal or provides a high impedance state to the pad connected to a second terminal in response to a second control signal. The Nth signal selecting unit either outputs an Nth electrical signal (N is an integer) received from a first terminal or provides a high impedance state to the pad connected to the second terminal in response to an Nth control signal.

REFERENCES:
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patent: 6549480 (2003-04-01), Hosogane et al.
patent: 2003/0065994 (2003-04-01), Kang et al.
patent: 2002-074996 (2002-03-01), None
patent: 10-0292702 (2001-06-01), None
patent: 94/22563 (1994-10-01), None
patent: 2004/031108 (2004-04-01), None

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