Semiconductor test chip with on wafer switching matrix

Details Semiconductor test chip with on wafer switching matrix Semiconductor test chip with on wafer switching matrix

1994-10-27

1996-04-16

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, 371 222, G01R 3102, G01R 3128

Patent

active

055086314

ABSTRACT:
A semiconductor test chip has an array of active semiconductor devices to be individually tested, a number of test lines for connection to external test circuitry, an enabling circuit associated with each device for selectively connecting it to the test lines, an input for receiving an instruction identifying a device that it is desired to test, and a decoder incorporated into the chip for receiving the instruction from the input. The decoder is connected by enabling lines to the individual test devices so that on receipt of an instruction the decoder enables the identified test device such that it becomes connected to the test lines. This circuit is more efficient and less cumbersome than the prior art.

REFERENCES:
patent: 4719411 (1988-01-01), Buehler
patent: 4800332 (1989-01-01), Hutchins
patent: 4864165 (1989-09-01), Hoberman et al.
patent: 5309091 (1994-05-01), El-Ayat et al.

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