Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1995-01-25
1996-05-07
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
3241581, G01R 1512
Patent
active
055149766
ABSTRACT:
A semiconductor test apparatus including a current load circuit, by which ringing otherwise caused during a high-speed digital test can be prevented on both the overshoot and undershoot sides, is provided. In a current load circuit, a source current load circuit and a sink current load circuit are associated with a first current load switching voltage setting circuit and a second current load switching voltage setting circuit, respectively, which can be set separately so that high and low levels of the signal waveform are clamped to respective potentials to clip overshoot and undershoot in the ringing waveform. A rectifying diode circuit allows a sink current to flow when overshoot is about to occur, and allows a source current to flow when undershoot is about to occur.
REFERENCES:
patent: 4333049 (1982-06-01), Yui et al.
patent: 4651088 (1987-03-01), Sawada
patent: 4720671 (1988-01-01), Tada et al.
Tsunetomo et al, "High Speed Testing Technique For CMOS LSI With High Impedance Transmission Lines", Technical Report of IEIEC ICD92-121, 1992, pp. 45-50.
Mitsubishi Denki & Kabushiki Kaisha
Nguyen Vinh P.
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