Semiconductor test apparatus for testing semiconductor...

Details Semiconductor test apparatus for testing semiconductor... Semiconductor test apparatus for testing semiconductor...

2006-07-18

2006-07-18

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C324S765010

Reexamination Certificate

active

07078889

ABSTRACT:
A recovery clock synchronized with an internal clock faster than a system clock is obtained with an edge timing of the system clock output from a DUT. The present invention includes: a time interpolator20which includes flip-flops (FF21) which receive system clocks of the DUT1, a delay circuit22which outputs time-series level data, from the FF21, and an encoder28which receives the time-series level data output and encodes it into positional data indicative of an edge timing; a digital filter40which includes a plurality of registers41which sequentially store the positional data and output the positional data as a recovery clock; and a data side selector30which selects output data of the DUT1base on the recovery clock.

REFERENCES:
patent: 6920470 (2005-07-01), Page et al.
patent: 2001/0052097 (2001-12-01), Miura

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