Semiconductor test apparatus and interface plate

Details Semiconductor test apparatus and interface plate Semiconductor test apparatus and interface plate

2008-03-04

2008-03-04

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S761010

Reexamination Certificate

active

07339385

ABSTRACT:
There is provided a semiconductor testing apparatus having a test head body having signal modules for processing the test signals, a plurality of connection cables electrically connected with the signal module and having connector pins at their ends, a plurality of types of connector housings for holding a plurality of connector pins, an interface plate having a plate body disposed on one face of the test head body and a plurality of connector blocks removably attached respectively to the plate body while storing a plural number of connector housings of either type among the plurality of types and a performance board for removably holding the electronic device and for electrically connecting the plurality of connector pins to the electronic device by being attached to the interface plate.

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Patent Abstracts of Japan, Publication No. 2004-108898, Publication Date: Apr. 8, 2004, 2 pages.

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