Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate
2007-04-03
2007-04-03
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
Reexamination Certificate
active
10938386
ABSTRACT:
A semiconductor test apparatus comprising a test apparatus main body for generating a test pattern provided to a semiconductor device, a test head which contacts the semiconductor device and provides the test pattern generated by the test apparatus main body for the semiconductor device, a cable for delivering the test pattern to the test head from the test apparatus main body and a movable supporting unit for moving in a direction to release tension when tension occurs in the cable while holding the cable.
REFERENCES:
patent: 5670034 (1997-09-01), Lowery
patent: 5821440 (1998-10-01), Khater et al.
patent: 6023173 (2000-02-01), Khater et al.
patent: 6040699 (2000-03-01), Holmes
patent: 6043442 (2000-03-01), Park et al.
patent: 6157200 (2000-12-01), Okayasu
patent: 6646431 (2003-11-01), Parvez et al.
patent: 6734694 (2004-05-01), Tauchi et al.
patent: 201 19 289 (2002-02-01), None
patent: 0 526 996 (1993-02-01), None
patent: 06-069296 (1994-03-01), None
patent: 06-300819 (1994-10-01), None
patent: 2597779 (1999-05-01), None
patent: 2002-189037 (2002-07-01), None
Patent Abstracts of Japan, Publication No.: 06-300819, Publication Date: Oct. 28, 1994, 1 page.
Partial Translation of the Claims for JP2597779 Y2, Publication Date: May 14, 1999, 1 page.
Patent Abstracts of Japan, Publication No.: 06-069296, Publication Date: Mar. 11, 1994, 1 page.
Patent Abstracts of Japan, Publication No.: 2002-189037, Publication Date: Jul. 5, 2002, 1 page.
International Search Report for PCT/JP2004/013048 mailed on Dec. 14, 2004, 2 pages.
Supplementary European Search Report issued in European Application No. EP 04 78 7731 mailed on Sep. 11, 2006, 3 pages.
Advantest Corporation
Nguyen Ha Tran
Nguyen Tung X.
Osha & Liang LLP
LandOfFree
Semiconductor test apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor test apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor test apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3797368