Semiconductor systems utilizing materials that form rectifying j

Active solid-state devices (e.g. – transistors – solid-state diode – Schottky barrier – In integrated structure

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257471, H01L 27095, H01L 2947

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active

06091128&

ABSTRACT:
Disclosed are semiconductor systems, such as integrated circuits utilizing Schotky barrier and/or diffused junction technology, which semiconductor systems incorporate material(s) that form rectifying junctions in both metallurgically and/or field induced N and P-type doping regions, and methods of their use. Disclosed are Schottky barrier based inverting and non-inverting gate voltage channel induced semiconductor single devices with operating characteristics similar to multiple device CMOS systems and which can be operated as modulators, N and P-channel MOSFETS and CMOS formed therefrom, and (MOS) gate voltage controlled rectification direction and gate voltage controlled switching devices, and use of such material(s) to block parasitic current flow pathways. Simple demonstrative five mask fabrication procedures for inverting and non-inverting gate voltage channel induced semiconductor single devices with operating characteristics similar to multiple device CMOS systems are also presented.

REFERENCES:
patent: 4300152 (1981-11-01), Lepselter
patent: 4485550 (1984-12-01), Koeneke et al.
patent: 4696093 (1987-09-01), Welch
patent: 5049953 (1991-09-01), Mihara et al.
patent: 5177568 (1993-01-01), Homna et al.
patent: 5229323 (1993-07-01), Shimada et al.
patent: 5250834 (1993-10-01), Nowak
patent: 5663584 (1997-09-01), Welch
patent: 5760449 (1998-06-01), Welch
Etched Schottky Barrier MOSFETS Using a Single Mask, Hobeboom & Cobbold, Electronic Letters, vol. 7, No. 5/6 Mar. 1971.
SB-IGFET: An Insulated Gate Field Effect Transistor Using Schottky Barrier Contacts for Source and Drain, Lepselter & Sultanov. IEEE, Aug. 1968.
Formation kinetics of CrSi.sub.2 Films on Si substrates with and without interposed Pd.sub.2 Si layer, Olowolafe, J. App. Phys. vol. 47, No. 12, 1976.
Some Properties of Chromium Doped Silicon, Lebedev & Sultanov. Soviet Physics, vol. 4, No. 11, May 1971.
Compound Formation Between Amorphous Silicon & Chromium, Yacobie et al., J. App. Phys. 51(12) Dec. 1980.
Metalurgical & Electrical Properties of Chromium Silicon Interfaces, Martinez et al. Solid State Physics, vol. 23.
The Metal-Semiconductor Contact: Anacid Device With a new Future, Yu, IEEE Spectrum, Mar. 1970.

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