Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-09-18
2007-09-18
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S765010, C324S761010
Reexamination Certificate
active
10572185
ABSTRACT:
First, second, and third semiconductor switches are connected in series between input and output terminals and first and second voltage application circuits are connected in parallel to first and third semiconductor switches, whereby providing a semiconductor switch circuit. Each voltage application circuit comprises a first or second voltage application semiconductor switch connected at the output side thereof with a first or second direct current amplifier having a gain state of approximately +1 and whose input side is connected to the input or output terminal. One end of the first or second voltage application semiconductor switch is connected to a first junction of the first and second semiconductor switches, or to a junction of the second and third semiconductor switches, respectively. When first through third semiconductor switches are turned OFF, first and second voltage application semiconductor switches are turned ON to apply the potentials of input and output terminals to the first and second junctions, respectively.
REFERENCES:
patent: 2004/0183508 (2004-09-01), Toyoda et al.
patent: 03-029512 (1991-02-01), None
Office Action issued on Mar. 16, 2007 for Korean Patent Application No. 10 2006-7004590 with its full English translation.
Office Action issued on Apr. 10, 2007 for Japanese Patent Application No. 2005 514044 with its full English translation.
Advantest Corporation
Gallagher & Lathrop
Lathrop, Esq. David N.
Nguyen Vincent Q.
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