Semiconductor substrate, method of manufacturing the...

Active solid-state devices (e.g. – transistors – solid-state diode – Incoherent light emitter structure

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S098000

Reexamination Certificate

active

11092804

ABSTRACT:
A semiconductor substrate comprises a semiconductor layer comprising a group III nitride as a main component. A scattering portion for scattering an incident beam of light incident on one plane of the semiconductor layer is provided on another plane or inside of the semiconductor layer.

REFERENCES:
patent: 5272108 (1993-12-01), Kozawa
patent: 5679152 (1997-10-01), Tischler et al.
patent: 5810925 (1998-09-01), Tadatomo et al.
patent: 6091085 (2000-07-01), Lester
patent: 6233264 (2001-05-01), Sato
patent: 6252894 (2001-06-01), Sasanuma et al.
patent: 6417901 (2002-07-01), Okada et al.
patent: 6549552 (2003-04-01), Omi et al.
patent: 2002/0197764 (2002-12-01), Uemura et al.
patent: 10-004209 (1998-06-01), None
patent: 2000-12900 (2000-01-01), None
patent: 2000-22212 (2000-01-01), None
Korean Office Action dated Apr. 19, 2007.
Richard C. Jaeger, “Introduction to Microelectronic Fabrication”, vol. 5, Addision Wesley Longman, Chapter 2, Lithography, pp. 13-26 (1993).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor substrate, method of manufacturing the... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor substrate, method of manufacturing the..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor substrate, method of manufacturing the... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3910190

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.