Semiconductor substrate having compound semiconductor layer, pro

Single-crystal – oriented-crystal – and epitaxy growth processes; – Processes of growth from liquid or supercritical state – Liquid phase epitaxial growth

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

117 58, 117 84, 117 94, 117104, 117108, 117954, C30B 1900

Patent

active

061066133

ABSTRACT:
In a semiconductor substrate comprising a silicon substrate having a porous region, and a semiconductor layer provided on the porous region, the semiconductor layer comprises a single-crystal compound and is formed on the surface of the porous region with its pores having been sealed at the surface. This substrate can be produced by a process comprising the steps of heat-treating the silicon substrate 11 having a porous region, to seal pores at the surface of the porous region 13, and forming a single-crystal compound-semiconductor layer 14 by heteroepitaxial growth on the porous region having the pores sealed by the heat treatment.
Single-crystal compound semiconductor films with less crystal defects can be formed on large-area silicon substrates in a high productivity, a high uniformity, a high controllability and a great economical advantage.

REFERENCES:
patent: 5258322 (1993-11-01), Sakaguchi et al.
patent: 5356509 (1994-10-01), Terranova et al.
patent: 5371037 (1994-12-01), Yonehara
patent: 5439843 (1995-08-01), Sakaguchi
patent: 5712199 (1998-01-01), Nakagawa
patent: 5869387 (1999-02-01), Sato et al.
Vyas, S. et al., "Growth of epitaxial Ge(x)Si(1-x) for infrared detectors by UHV/CVD", Vacuum vol. 46 No. 8-10 (1065-1069), 1995.
Fernandez, J.M. et al., "Silicon/silicon-germanium multiple quantum wells grown by gas-source molecular beam epitaxy: hydrogen coverage and interfacial abruptness", Journal of Crystal Growth 164 (241-247), 1966.
Marschner, T. et al., "Epitaxial layer morphology of highly strained GaInAs/InP multiple quantum well structures grown by CBE", Microelectronics Journal vol. 28 (849-855), 1997.
Lecture Drafts for the 48th Scientific Lecture Meeting of the Society of Applied Physics, Nagoya University in Japan, Oct. 17-20, 1987, p. 230. In Japanese with English translation.
K. Maehashi et al., "Initial Stages of GaAs Molecular Beam Epitaxy Growth on Porous Si", Japan. J. Appl. Phys., vol. 30, No. 4B, pp. L683-L685 (1991).
V. Labunov et al., "Heat Treatment Effect on Porous Silicon", Thin Solid Films, vol. 137, No. 1, pp. 123-134 (1986).
T.W. Kang et al., "Growth of GaAs epitaxial layers on porous silicon", Microelectronics J., vol. 27, No. 4/05, pp. 423-436 (1996).
T. Unagami et al., "Structure of Porous Silicon Layer and Heat-Treatment Effect", J. Electrochem. Soc., vol. 125, No. 8, pp. 1339-1344 (1978).
Patent Abstracts of Japan, vol. 097, No. 003, Mar. 31, 1997 (corresponds to JP 08-316192).
J.C. Campbell et al., "Photoluminescence of porous silicon buried underneath epitaxial GaP", Appl. Phys. Lett., vol. 60, No. 7, pp. 889-891 (1992).
N. Sato, "Epitaxial Growth on Porous Si for a New Bond and Etchback Silicon-on-Insulator", J. Electrochem. Soc., vol. 142, No. 9, Sep. 1995, pp. 3116-3122.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor substrate having compound semiconductor layer, pro does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor substrate having compound semiconductor layer, pro, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor substrate having compound semiconductor layer, pro will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-575944

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.