Semiconductor substrate and method of manufacturing same

Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates – Thinning of semiconductor substrate

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438508, 438495, H01L 2130

Patent

active

060081104

ABSTRACT:
A semiconductor substrate has a support substrate formed of monocrystal silicon, an oxide film formed on the support substrate and a thin film of monocrystal silicon formed on the oxide film. The support substrate is a high-concentration P-type substrate to which boron is so doped that a resistivity of the support base is 0.1 .OMEGA..cm or less. In manufacturing: boron is into the support base so that a resistivity of the support base is 0.1 .OMEGA..cm or less; a silicon substrate on which the thin film of monocrystal silicon is formed is heated at 1100.degree. C. or higher for 30 min or longer within a reducing atmosphere; the heat treated silicon substrate is attached to the high-concentration P-type support substrate via the oxide film formed on a surface of any one of the support substrate and the P-type silicon substrate and the attached substrates are heated at 950.degree. C. or higher for 10 min or longer to bond the attached substrates together; and the bonded silicon substrate is thinned.

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patent: 5453394 (1995-09-01), Yonehara et al.
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patent: 5565690 (1996-10-01), Theodore et al.
patent: 5650354 (1997-07-01), Himi et al.
patent: 5670411 (1997-09-01), Yonehara et al.

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