Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate
2007-03-13
2007-03-13
Huynh, Andy (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Of specified material other than unalloyed aluminum
C257S758000, C257S774000, C257S778000
Reexamination Certificate
active
10519860
ABSTRACT:
An integrated semiconductor structure has a substrate, a semiconductor element located on the substrate, a pad metal, metal layers located between the pad metal and the substrate, and insulation layers that separate the metal layers from one another. The pad metal extends over at least—part of the semiconductor element.Below the surface of the pad metal, at least the top two metal layers include two or more adjacent interconnects.
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International Search Report from corresponding PCT application No. PCT/DE2003/001955.
Preliminary Examination Report from corresponding PCT application No. PCT/DE2003/001955.
Bauer Robert
Ertle Werner
Frohnmüller Till
Goller Bernd
Greiderer Reinhard
Brinks Hofer Gilson & Lione
Huynh Andy
Infineon - Technologies AG
Nguyen Tram H.
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