Semiconductor device manufacturing: process – Forming tapered edges on substrate or adjacent layers
Reexamination Certificate
2007-09-25
2007-09-25
Pert, Evan (Department: 2826)
Semiconductor device manufacturing: process
Forming tapered edges on substrate or adjacent layers
C438S928000, C438S963000, C257SE21214, C257SE21237
Reexamination Certificate
active
10710405
ABSTRACT:
A semiconductor structure and a method of fabrication there-for are provided. The semiconductor structure comprises a substrate, a dielectric layer disposed over the substrate, a hydrophilic material layer disposed over the dielectric layer, and a hardmask layer disposed over the hydrophilic material layer. It is noted that, the edge of the semiconductor structure may be polished after the hydrophilic material layer is formed over the dielectric layer and before the hardmask layer is formed over the hydrophilic material layer.
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Chen Jiann-Fu
Shiau Chih-Hsiang
Wu Yi-Ching
Jianq Chyun IP Office
Mandala Jr. Victor A.
Pert Evan
United Microelectronics Corp.
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